x  X <br/><br/>
Thin film and depth proile analysis  x 

 - x 
 - Berlin ; New York  Springer - Verlag  1984 
 - xi, 205 
<br/><br/>Inlcudes 
<br/><br/><label>ISBN: </label>0387133208 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin film - surcfaces Spauttering (Physics) 
<br/><br/><label>Dewey Class. No.: </label>530.41/T443