Normal view MARC view ISBD view

Thin film and depth proile analysis x

x X

Thin film and depth proile analysis x - x - Berlin ; New York Springer - Verlag 1984 - xi, 205

Inlcudes

ISBN: 0387133208

Subjects--Topical Terms:
Thin film - surcfaces Spauttering (Physics)

Dewey Class. No.: 530.41/T443

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)